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Grid Distortion Test Targets![]()
R1L3S5P Combined Resolution and R1L3S3P Multi-Frequency Grid R2L2S3P4 Fixed Frequency Grid R1L1S1N Combined Resolution and Related Items ![]() Please Wait
![]() Click to Enlarge An R1L3S5P Combined Resolution and Distortion Test Target Mounted in an XYF1 Test Target Positioner Features
Thorlabs offers a variety of options for measuring the distortion of an optical system including targets with a single-frequency grid, multi-frequency grids, or distortion grids alongside a wide variety of other patterns for resolution measurement, calibration, and more. Combined, these targets offer grid spacings ranging from 10 µm to 2000 µm. Each target is made from a soda lime glass substrate with vacuum-sputtered, low-reflectivity chrome in patterns of either horizontal and vertical lines or rows and columns of solid circles. Each pattern is manufactured using photolithography, allowing for edge features to be resolved down to approximately 1 µm. Because the lines or rows and columns are perpendicular, they will be imaged as such by an ideal system. A distorted image will show the lines or rows and columns as bowed; this image allows the user to quantify the distortion and thus to correct for it using software built into programs such as LabVIEW or ImageJ. Mounting
![]() ![]() Click to Enlarge An R2L2S3P3 Target Post Mounted via an FFM1 Filter Mount and a B3C Cube Base for Use in a Custom Imaging System ![]() Click to Enlarge A Close Up of the Dot Pattern on the R2L2S3P4 Target
These distortion grid arrays each feature a single grid of dots fabricated from the deposition of vacuum-sputtered, low-reflectivity chrome on a soda lime glass substrate. The available grid spacings, which are measured from the center of any dot to the center of any adjacent dot, range from 125 µm to 1000 µm, and the dot diameters range from 62.5 µm to 500 µm. Grid arrays are used to determine the distortion of an imaging system. Ideally, the horizontal and vertical rows of dots should be perpendicular to each other. A distorted image will show the array as bowed; this image can then be used to correct for distortion.
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The R1L3S3P grid distortion target features four arrays of horizontal and vertical lines spaced 10 µm, 50 µm, 100 µm, and 500 µm apart. This pattern is fabricated from the deposition of vacuum-sputtered, low-reflectivity chrome with an optical density (OD) of ≥3 at 430 nm on a 3" x 1" x 0.06" (76.2 mm x 25.4 mm x 1.5 mm) soda lime glass substrate. The dimensions of the glass substrate are the same as a standard microscope slide. Grid arrays are used to determine the distortion of an imaging system. Ideally, the horizontal and vertical lines of the grid should be perpendicular to each other. A distorted image will show the lines as bowed; this image can then be used to correct for distortion. ![]() ![]() Click to Enlarge Close Up of the Smaller Grid on the R3L3S5P Target with Labels Added (See Tables Below)
Thorlabs' 3" x 3" (76.2 mm x 76.2 mm) Concentric Circle and Crosshair Grid Target offers 289 individual grids, arranged in a larger, 2" x 2" grid of 17 rows and 17 columns. The smaller grids each have four concentric circle patterns and five crosshair patterns of varying sizes. The concentric circle and crosshair patterns on the smaller grids are labeled in the image to the right but not on the target itself. Each concentric circle pattern features seven different radii, while the crosshairs each have a single or a double cross. For details on the dimensions of these patterns, see the tables below. The pattern on this target is made from low-reflectivity, vacuum-sputtered chrome deposited on a 0.6" (1.5 mm) thick soda lime glass substrate to achieve an optical density of ≥3. The dark pattern and clear substrate are useful for front-lit and general applications.
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Thorlabs offers positive and negative 18 mm x 18 mm x 1.5 mm combined resolution / distortion test targets that are made by plating vacuum-sputtered, low-reflectivity chrome with an optical density (OD) of ≥3 at 430 nm on a soda lime glass substrate. They are ideal for calibration of imaging systems and microscope stages. The test targets include a 1951 USAF pattern (Groups 2 - 7), a sector star, concentric circles, grids (100 µm, 50 µm, and 10 µm), and Ronchi rulings (30 - 150 lp/mm). These targets are useful for testing resolution, field distortion, focus errors, and astigmatism. The USAF 1951 targets are useful for measuring imaging resolution. The grids can be used to measure image distortion, while the concentric circles are ideal for identifying focus errors, astigmatism, and other aberrations existing in an imaging system. The Ronchi rulings are excellent for evaluating resolution, field distortion, and parfocal stability. For more information, please see our Resolution Targets page. These resolution targets are offered in positive and negative versions. The R1L1S1P positive target consists of a chrome pattern plated on to a clear substrate and is useful for front-lit and general applications. Alternatively, the R1L1S1N negative target uses the same chrome coating to cover the substrate, leaving the pattern itself clear, and works well in back-lit and highly illuminated applications.
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Thorlabs offers positive 3" x 1" x 0.06" (76.2 mm x 25.4 mm x 1.5 mm) combined resolution / distortion test targets that are made by plating vacuum-sputtered, low-reflectivity chrome with an optical density (OD) of ≥3 at 430 nm on a soda lime glass substrate. They are ideal for calibration of imaging systems and microscope stages. They are sized to fit in our MLS203P2 stage slide holder for use with our MLS203 microscope stages. The test targets include an NBS 1963A pattern, a sector (Siemens) star, concentric circles, grids, Ronchi rulings, and more (see table below). These targets are useful for testing resolution, field distortion, focus errors, and astigmatism. The NBS 1963A, sector star, and concentric circle targets are useful for measuring imaging resolution. The grids can be used to measure the distortion introduced by an imaging system. The Ronchi rulings are excellent for evaluating resolution, field distortion, and parfocal stability. For more information, please see our Resolution Targets page.
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