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Grid Distortion Test Targets


  • Test Targets Help Identify Distortion in Imaging Systems
  • Grid Spacings Available from 10 µm to 2000 µm
  • Combined Resolution and Distortion Targets Available

R1L3S5P

Combined Resolution and
Distortion Test Target

R1L3S3P

Multi-Frequency Grid
Distortion Target

R2L2S3P4

Fixed Frequency Grid
Distortion Target

R1L1S1N

Combined Resolution and
Distortion Test Target

Related Items


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General Specifications
Chrome Thickness 0.120 µm
Chrome Optical Density OD ≥3 at 430 nm
Substrate Thickness 0.06" (1.5 mm)
Surface Flatness <5 µm
Line Spacing Tolerancea ±1 µm
Line Width Tolerancea ±0.5 µm
Substrate Sode Lime Glass
  • This tolerance is valid for the mask used to create these targets and may differ minimally for the targets themselves.
Test Target
Click to Enlarge

An R1L3S5P Combined Resolution and Distortion Test Target Mounted in an XYF1 Test Target Positioner

Features

  • Fixed and Multi-Frequency Grid Distortion Test Targets
  • Combined Resolution and Distortion Test Targets
  • Distortion in Grid Image Allows for Image Correction
  • Grids Available with Spacings of 10 µm to 2000 µm

Thorlabs offers a variety of options for measuring the distortion of an optical system including targets with a single-frequency grid, multi-frequency grids, or distortion grids alongside a wide variety of other patterns for resolution measurement, calibration, and more. Combined, these targets offer grid spacings ranging from 10 µm to 2000 µm.

Each target is made from a soda lime glass substrate with vacuum-sputtered, low-reflectivity chrome in patterns of either horizontal and vertical lines or rows and columns of solid circles. Each pattern is manufactured using photolithography, allowing for edge features to be resolved down to approximately 1 µm. Because the lines or rows and columns are perpendicular, they will be imaged as such by an ideal system. A distorted image will show the lines or rows and columns as bowed; this image allows the user to quantify the distortion and thus to correct for it using software built into programs such as LabVIEW or ImageJ.

Mounting
These distortion test targets can be mounted in one of four of our microscopy slide holders. Our MAX3SLH fixed slide holder provides two spring clips to mount the optic and can be mounted to any of our 3-axis translation stages; this slide holder is only compatible with test targets greater than or equal to 2" wide and provides a clear aperture of 1", which may cover the chrome pattern on some of the test targets. Thorlabs also offers our XYF1(/M) test target positioning mount (see photo above), which is capable of translating a 1" (25.4) to 3" (76.2 mm) wide rectangular target over a 50 mm (1.97") x 30 mm (1.18") area. The mount offers five 8-32 (M4) taps for six post-mountable orientations. The XYF1 uses nylon-tipped setscrews to secure the optic. Please note that the mount's support arms overlap the optic by 4.4 mm on each side. For users of the MLS203 microscopy stage, we offer the MLS203P2 slide holder for inverted microscopes, which can mount slides that measure 25 mm to 26.5 mm in width and petri dishes that measure 30 mm to 60 mm in diameter.

Targets Selection Guide
Resolution Test Targets Distortion Test Targets Slant Edge MTF Resolution Test Targets Calibration Targets

Posted Comments:
dave.stubblefield  (posted 2017-02-23 07:04:15.327)
Do you have any distortion targets that are designed for the IR spectrum? 3-5 micron and 8-12 micron. Maybe with a different substrate? Most transmission curves that I can find for soda lime glass do not extend into the IR region.
tfrisch  (posted 2017-03-13 03:44:30.0)
Hello, thank you for contacting Thorlabs. I will reach out to you directly about our custom capabilities for etching distortion targets.

Fixed Frequency Grid Distortion Targets, 1.5" x 1.5"

R2L2S3P3 Application
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An R2L2S3P3 Target Post Mounted via an FFM1 Filter Mount and a B3C Cube Base for Use in a Custom Imaging System
R2L2S3P4 Close Up
Click to Enlarge

A Close Up of the Dot Pattern on the R2L2S3P4 Target
  • One Grid Array on a 1.5" x 1.5" (38.1 mm x 38.1 mm) Soda Lime Glass Substrate
  • 125 µm, 250 µm, 500 µm, or 1000 µm Grid Spacings
  • Ø62.5 µm, Ø125 µm, Ø250 µm, or Ø500 µm Dots
  • Ideal for Machine Vision Applications of Stage Calibration and Distortion Detection

These distortion grid arrays each feature a single 25.0 mm x 25.0 mm (0.98" x 0.98") grid of dots fabricated from the deposition of vacuum-sputtered, low-reflectivity chrome on a soda lime glass substrate. The available grid spacings, which are measured from the center of any dot to the center of any adjacent dot, range from 125 µm to 1000 µm, and the dot diameters range from 62.5 µm to 500 µm.

Grid arrays are used to determine the distortion of an imaging system. Ideally, the horizontal and vertical rows of dots should be perpendicular to each other. A distorted image will show the array as bowed; this image can then be used to correct for distortion.

Item #SpacingaSpacing
Tolerance
Dot SizeDot Size
Tolerance
Pattern SizebPattern Size
Tolerance
Pattern
Optical Density
Substrate Size
R2L2S3P1 125 µm ±1 µm Ø62.5 µm ±2 µm 25.0 mm x 25.0 mm
(0.98" x 0.98")
±4 µm OD ≥3 at 430 nm 1.5" x 1.5" x 0.06"
(38.1 mm x 38.1 mm x 1.5 mm)
R2L2S3P2 250 µm Ø125 µm
R2L2S3P3 500 µm Ø250 µm
R2L2S3P4 1000 µm Ø500 µm
  • Measured from the center of any dot to the center of any adjacent dot.
  • Measured from corner to corner on the grid array.
Based on your currency / country selection, your order will ship from Newton, New Jersey  
+1 Qty Docs Part Number - Universal Price Available
R2L2S3P1 Support Documentation
R2L2S3P1Customer Inspired! Grid Distortion Target, 1.5" x 1.5", 125 µm Grid Spacing
$402.38
Today
R2L2S3P2 Support Documentation
R2L2S3P2Customer Inspired! Grid Distortion Target, 1.5" x 1.5", 250 µm Grid Spacing
$343.55
Today
R2L2S3P3 Support Documentation
R2L2S3P3Customer Inspired! Grid Distortion Target, 1.5" x 1.5", 500 µm Grid Spacing
$295.22
Today
R2L2S3P4 Support Documentation
R2L2S3P4Customer Inspired! Grid Distortion Target, 1.5" x 1.5", 1000 µm Grid Spacing
$267.90
Today

Multi-Frequency Grid Distortion Target, 3" x 1"

Grid Array
Click to Enlarge
Close Up of the Four Grid Patterns on the R1L3S3P Target
  • Four Grid Arrays on a 3" x 1" (76.2 mm x 25.4 mm) Soda Lime Glass Slide
  • 10 µm, 50 µm, 100 µm, and 500 µm Grid Spacings
  • Ideal for Microscopy Applications of Stage Calibration and Distortion Detection
  • Same Outer Dimensions as a Standard Microscope Slide

The R1L3S3P grid distortion target features four arrays of horizontal and vertical lines spaced 10 µm, 50 µm, 100 µm, and 500 µm apart. This pattern is fabricated from the deposition of vacuum-sputtered, low-reflectivity chrome with an optical density (OD) of ≥3 at 430 nm on a 3" x 1" x 0.06"  (76.2 mm x 25.4 mm x 1.5 mm) soda lime glass substrate. The dimensions of the glass substrate are the same as a standard microscope slide.

Grid arrays are used to determine the distortion of an imaging system. Ideally, the horizontal and vertical lines of the grid should be perpendicular to each other. A distorted image will show the lines as bowed; this image can then be used to correct for distortion.

Based on your currency / country selection, your order will ship from Newton, New Jersey  
+1 Qty Docs Part Number - Universal Price Available
R1L3S3P Support Documentation
R1L3S3PGrid Distortion Target, 3" x 1", 10, 50, 100, and 500 µm Grid Spacings
$241.64
5-8 Days

Concentric Circle and Crosshair Grid Target, 3" x 3"

NBS 1952
Click to Enlarge
Close Up of the Smaller Grid on the R3L3S5P Target with Labels Added (See Tables Below)
NBS 1952
Click to Enlarge
Close Up of Entire Pattern on the R3L3S5P Target
  • Concentric Circles and Crosshair Patterns Arranged in a Grid
  • Four Different Concentric Circle Sizes and Five Different Crosshair Sizes
  • Measure Resolution and Distortion of an Imaging System
  • 3" x 3" (76.2 mm x 76.2 mm) Soda Lime Glass Substrate

Thorlabs' 3" x 3" (76.2 mm x 76.2 mm) Concentric Circle and Crosshair Grid Target offers 289 individual grids, arranged in a larger, 2" x 2" grid of 17 rows and 17 columns. The smaller grids each have four concentric circle patterns and five crosshair patterns of varying sizes. The concentric circle and crosshair patterns on the smaller grids are labeled in the image to the right but not on the target itself. Each concentric circle pattern features seven different radii, while the crosshairs each have a single or a double cross. For details on the dimensions of these patterns, see the tables below.

The pattern on this target is made from low-reflectivity, vacuum-sputtered chrome deposited on a 0.6" (1.5 mm) thick soda lime glass substrate to achieve an optical density of ≥3. The dark pattern and clear substrate are useful for front-lit and general applications.

Concentric Circles
Circle Patterna R1 R2 R3 R4 R5 R6 R7
A1 31.3 µm 62.5 µm 125 µm 140.6 µm 234.4 µm 242.2 µm 500 µm
A2 15.6 µm 31.3 µm 62.5 µm 70.3 µm 117.2 µm 121.1 µm 250 µm
A3 7.8 µm 15.6 µm 31.3 µm 35.2 µm 58.6 µm 60.5 µm 125 µm
A4 3.9 µm 7.8 µm 15.6 µm 17.6 µm 29.3 µm 30.3 µm 62.5 µm
  • As indicated by the photo above and to the right.
Crosshairs
Crosshair Patterna Single or Double Line Length/Width Line Widthb
B1 Double 500 µm 6.25 µm
B2 Double 500 µm 12.5 µm
B3 Single 500 µm 50 µm
B4 Double 500 µm 25 µm
B5 Double 500 µm 100 µm
  • As indicated by the photo above and to the right.
  • The line width is equal to the spacing between the lines.
Based on your currency / country selection, your order will ship from Newton, New Jersey  
+1 Qty Docs Part Number - Universal Price Available
R3L3S5P Support Documentation
R3L3S5PConcentric Circle and Crosshair Grid Target, 3" x 3"
$535.81
Lead Time

Combined Resolution and Distortion Test Targets, 18 mm x 18 mm

Combined Resolution Test Target
Click to Enlarge
Microscope Image of the R1S1L1N Negative Test Target
  • Determine Resolution of an Optical System
  • Measure Image Distortion, Astigmatism, and Other Aberrations
  • 18 mm (0.71") Square, 1.5 mm Thick Soda Lime Substrate
  • Includes 1951 USAF Pattern, Sector Star, Concentric Circles, Grids, and Ronchi Rulings
  • Positive and Negative Patterns Available

Thorlabs offers positive and negative 18 mm x 18 mm x 1.5 mm combined resolution / distortion test targets that are made by plating vacuum-sputtered, low-reflectivity chrome with an optical density (OD) of ≥3 at 430 nm on a soda lime glass substrate. They are ideal for calibration of imaging systems and microscope stages.

The test targets include a 1951 USAF pattern (Groups 2 - 7), a sector star, concentric circles, grids (100 µm, 50 µm, and 10 µm), and Ronchi rulings (30 - 150 lp/mm). These targets are useful for testing resolution, field distortion, focus errors, and astigmatism. The USAF 1951 targets are useful for measuring imaging resolution. The grids can be used to measure image distortion, while the concentric circles are ideal for identifying focus errors, astigmatism, and other aberrations existing in an imaging system. The Ronchi rulings are excellent for evaluating resolution, field distortion, and parfocal stability. For more information, please see our Resolution Targets page.

These resolution targets are offered in positive and negative versions. The R1L1S1P positive target consists of a chrome pattern plated on to a clear substrate and is useful for front-lit and general applications. Alternatively, the R1L1S1N negative target uses the same chrome coating to cover the substrate, leaving the pattern itself clear, and works well in back-lit and highly illuminated applications.

Target Feature Details Target Feature Details
1951 USAF Target Groups 2 - 7 Concentric Circles 10 Circles with Radii from 100 µm to 1000 µm in 100 µm Intervals, Labeled 1 to 10
Grids 20 x 20 Arrays with 100 µm, 50 µm, and 10 µm Pitch Ronchi Rulings 13 Rulings from 30 lp/mma to 150 lp/mm in 10 lp/mm Intervals
Sector Star 36 Bars through 360°, 10 µm Radius Center Circle, and Ten Concentric Circles with Radii from 50 µm to 500 µm in 50 µm Intervals
  • Line Pairs per Millimeter
Based on your currency / country selection, your order will ship from Newton, New Jersey  
+1 Qty Docs Part Number - Universal Price Available
R1L1S1P Support Documentation
R1L1S1PCustomer Inspired! Positive Combined Resolution and Distortion Test Target, 18 mm Square
$520.05
Today
R1L1S1N Support Documentation
R1L1S1NCustomer Inspired! Negative Combined Resolution and Distortion Test Target, 18 mm Square
$520.05
Today

Combined Resolution and Distortion Test Target, 3" x 1"

 

Frequencies of NBS 1963A (cycles/mm)
  • 4.5 • 10 • 23 • 51 • 114
  • 5 • 11 • 25 • 57 • 128
  • 5.6 • 12.5 • 29 • 64 • 144
  • 6.3 • 14 • 32 • 72 • 161
  • 7.1 • 16 • 36 • 81 • 181
  • 8 • 18 • 40 • 91 • 203
  • 9 • 20 • 45 • 102 • 228
  • 3" x 1"  (76.2 mm x 25.4 mm) Soda Lime Substrate
  • Includes NBS 1963A Pattern, Sector Star, Concentric Circles, Grids, Ronchi Rulings, and More (See Table Below)
  • Determine Resolution of an Optical System
  • Measure Image Distortion, Astigmatism, and Other Aberrations
  • Compatible with our MLS203 Microscope Stages via MLS203P2 Slide Holder

Thorlabs offers positive 3" x 1" x 0.06" (76.2 mm x 25.4 mm x 1.5 mm) combined resolution / distortion test targets that are made by plating vacuum-sputtered, low-reflectivity chrome with an optical density (OD) of ≥3 at 430 nm on a soda lime glass substrate. They are ideal for calibration of imaging systems and microscope stages. They are sized to fit in our MLS203P2 stage slide holder for use with our MLS203 microscope stages.

The test targets include an NBS 1963A pattern, a sector (Siemens) star, concentric circles, grids, Ronchi rulings, and more (see table below). These targets are useful for testing resolution, field distortion, focus errors, and astigmatism. The NBS 1963A, sector star, and concentric circle targets are useful for measuring imaging resolution. The grids can be used to measure the distortion introduced by an imaging system. The Ronchi rulings are excellent for evaluating resolution, field distortion, and parfocal stability. For more information, please see our Resolution Targets page.

Target Feature Details Target Feature Details
NBS 1963A Frequencies from 4.5 cycles/mm to 228 cycles/mm (See List Above) Concentric Circles 10 Circles with Radii from 100 µm to 1000 µm in 100 µm Intervals
Distortion Grid (Squares) 3 Grids: 100 lp/mma, 150 lp/mm, 200 lp/mm Fixed Ronchi Rulings 3 Rulings:100 lp/mm, 150 lp/mm, and 200 lp/mm
Distortion Grid (Dots) 3 Grids: 400 µm Pitch of Ø80 µm Dots,
200 µm Pitch of Ø 40 µm Dots, 100 µm Pitch of Ø20 µm Dots
Variable Ronchi Rulings 20 Rulings (Each 1 mm x 1 mm): 10 lp/mm to 200 lp/mm in 10 lp/mm Intervals
Two-Point Resolution Dots Ø25 µm, Ø20 µm, Ø15 µm, Ø12.5 µm, Ø10 µm, Ø7.5 µm, and Ø5 µm Pinholes Ø25 µm, Ø20 µm, Ø15 µm, Ø12.5 µm, Ø10 µm, Ø7.5 µm, and Ø5 µm
Interdigitated Lines 6.25 lp/mm, 12.5 lp/mm, 25 lp/mm, 50 lp/mm, 100 lp/mm, and 200 lp/mm Micrometers 3 Rulers: 10 mm Scale with 50 µm Divs, 1 mm Scale with 10 µm Divs, and 1mm x 1 mm XY Scale with 50 µm Divs
Sector Star 36 Bars through 360°, 50 µm Radius Center Circle, and Ten Concentric Circles with Radii from 100 µm to 500 µm in 50 µm Intervals
  • The unit lp/mm is line pairs per millimeter.
Based on your currency / country selection, your order will ship from Newton, New Jersey  
+1 Qty Docs Part Number - Universal Price Available
R1L3S5P Support Documentation
R1L3S5PCustomer Inspired! Positive Combined Resolution and Distortion Test Target, 3" x 1"
$964.45
Today
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