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Figure 1. An R1DS3N Negative Reticle and a DG10-1500 Diffuser shown mounted with the ground side against the reticle. Together, they create an alignment target for a CPS520 Laser Diode Module that is mounted in KAD11F Kinematic Adapter and an LM1XY Translation Mount. The light is incident on the polished side of the diffuser.

Features

• Positive and Negative Crosshair and Concentric Circle Patterns
• Available Sizes: Ø19.0 mm, Ø21.0 mm, or Ø1"
• UV Fused Silica Substrate
• Patterns Made of Chrome Layer that is 0.120 µm Thick

Reticles are optics designed for insertion in the eyepiece of an imaging system that superimpose either a crosshair or concentric circle pattern on the imaged object. The pattern provides a reference location and allows the imaged object to be centered. Because they are intended to be used in transmission, Thorlabs' line of reticles is made from a UV fused silica substrate, unlike our test targets, which are made from soda lime glass. UV fused silica provides excellent transparency from the infrared down into the ultraviolet.

Many of our reticles are available with positive and negative patterns. The positive reticles consist of high-reflectivity, vacuum-sputtered chrome patterns plated on clear substrates and are useful for front-lit and general applications. The negative reticles use the same chrome coating to cover the substrates, leaving the patterns clear, and work well in back-lit and highly illuminated applications.

All the parts shown here are manufactured at Thorlabs' in-house semiconductor device production facility in Jessup, Maryland. Our extensive production capabilities enable us to provide solutions for imaging system calibration and measurements. We use contact photolithography with a mask aligner to define the pattern on the glass substrate. Once the pattern is defined, we chemically etch the substrates and clean them in a class 100 cleanroom.

Thorlabs also offers a selection of test targets, calibration targets, and stage micrometers for imaging systems.

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Figure 3. View through the Reticle shown in Fig. 1 when the laser is misaligned

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Figure 2. View through the reticle shown in Fig. 1 when the laser is aligned

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Transmission for 1.0 mm UVFS Substrate
For a graph that extends to 3.2 µm, please see the Graphs tab.

The following transmission plot was measured at normal incidence using a UV fused silica substrate that was 1.0 mm thick. The transmission for the reticles sold here will be slightly lower because of their 1.5 mm thickness.

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Transmission from 200 nm - 3.2 µm