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HgCdTe (MCT) Amplified Photodetector


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HgCdTe (MCT) Amplified Photodetector

PDA10JT Top View
Top View Showing Signal Output and Power Input
Click to Enlarge
PDA10JT Side View
Side View Showing Gain and Bandwidth Adjusters
Click to Enlarge

Features

  • Provides Detection of Mid-IR (MIR) Light from 2.0 - 5.4 µm
  • Low-Pass Filter Bandwidth up to 160 kHz
  • Variable Gain Amplifier Range: 0.8 V/V to 100 V/V
  • Thermoelectrically Cooled 1 mm x 1 mm Detector Element
  • Internal SM1 (1.035"-40) Threading
  • Location-Specific Power Adapter Included

Thorlabs' HgCdTe (mercury cadmium telluride, MCT) Amplified Detector is a thermoelectrically cooled photoconductive detector that is designed for the mid-IR spectral range from 2.0 µm to 5.4 µm. It has a built-in, two-stage thermoelectric cooler (TEC) element with thermistor feedback that stabilizes the detector temperature at -30 °C, thereby reducing thermally generated noise. The cooling also provides higher gains and lower DC offset at the detector output. The detector also features two 8-position rotary switches that allow the adjustment of low-pass filter bandwidth and gain. For best results, we recommend connecting the output cable (not included) to a 50 Ω termination. Because the detector is AC coupled, it requires a pulsed or chopped input signal.

MIR Photodetector Selection Guide
Wavelength
Range
Maximum
Bandwidth
Minimum NEPItem # (Detector)
1.0 - 2.9 µm1 kHz1.5 x 10-11 W/√HzPDA30G (PbS)
1.0 - 5.8 µm1600 kHz1.71 x 10-9 W/√HzPDA10PT (InAsSb)
1.5 - 4.8 µm10 kHz1.5 x 10-10 W/√HzPDA20H (PbSe)
2.0 - 5.4 µm160 kHz2.08 x 10-11 W/√HzPDA10JT (HgCdTe)

This amplified photodetector incorporates many of the same features as our switchable-gain PDA detectors. An internal SM1 (1.035"-40) threading allows Ø1" lens tubes to be mounted in front of the detector element. Two 8-32 (M4 in the -EC version) tapped holes connect a Ø1/2" post to the housing in one of two perpendicular orientations, as shown in the image at the top of the page. The PDA10PT includes a 100 - 120 VAC power adapter, while the PDA10PT-EC ships with a 220 - 240 VAC power adapter. If you require a different adapter plug, please contact Tech Support prior to ordering. An SM1RR Retaining Ring is also included.

Please note that inhomogeneities at the edges of the active area of the detector can generate unwanted capacitance and resistance effects that distort the time-domain response of the output. Thorlabs therefore recommends that the incident light is well centered on the active area. The SM1 (1.035"-40) threading on the housing can be connected to an SM1 lens tube; the lens tube can be used to mount an iris or pinhole in front of the detector element. Because the detector package protrudes 3.9 mm beyond the front of the threading, optics and optomechanics cannot be attached directly to the housing.

If a more compact detector housing is desired, Thorlabs also manufactures room-temperature amplified photodetectors sensitive in the NIR and MIR regions. We also offer an InAsSb-based detector with broader wavelength sensitivity at the expense of a higher NEP.

Gain (High Z)a
0 dB0.8 V/V
4 dB1.6 V/V
10 dB3.2 V/V
16 dB6.3 V/V
22 dB12.6 V/V
28 dB25.2 V/V
34 dB50.1 V/V
40 dB100 V/V
  • The gain for a 50 Ω impedance is one-half of the gain for high Z.
NEP Valuesb
0 dB1.90 × 10-9 W/√Hz
4 dB1.19 × 10-9 W/√Hz
10 dB5.94 × 10-10 W/√Hz
16 dB3.02 × 10-10 W/√Hz
22 dB1.51 × 10-10 W/√Hz
28 dB7.61 × 10-11 W/√Hz
34 dB3.86 × 10-11 W/√Hz
40 dB2.08 × 10-11 W/√Hz

b. Filter Bandwidth = 160 kHz, Impedance = 50 Ω

Item #PDA10JT(-EC)
Detector MaterialHgCdTe (MCT)
Wavelength Range2.0 - 5.4 μm
Peak Wavelength4.8 μm
Peak Response300 V/W
Number of Gain Steps8
Active Area1 mm × 1 mm
Surface Depth0.08" (2 mm)
Number of Lowpass Filter Steps8
Lowpass Filter Bandwidth Range1.25 to 160 kHz
Output Voltage0 - 5 V @ 50 Ω, 0 - 10 V @ Hi-Z
Output Impedance50 Ω
Output Current100 mA
Load Impedance50 Ω to Hi-Z
Output Offset20 mV (45 mV Max)
Detector Temeprature-30 °C
TEC Current0.6 A Typical (1 A max)
Thermistor10 kΩ
On/Off SwitchSlide
OutputBNC
Detector Size3" × 2.2" × 2.2"
(76.2 mm × 55.9 mm × 55.9 mm)
Weight (Detector/Power Supply)0.42 / 2.1 lbs
AccessoriesSM1RR (SM1 Retaining Ring)
AC Power Supply31 W, AC-DC Converter (Included)
Input Power100 - 120 VAC, 50 - 60 Hz 
(220 - 240 VAC -EC Version)
Storage Temperature0 - 85 °C
Operating Temperature0 - 30 °C

Note: D* (detectivity) is defined as:

Detectivity

where A is the area of the photosensitive region of the detector, Δf is the effective noise bandwidth, and NEP is the noise equivalent power.


Output Signal

BNC Female

BNC Female

0 - 5 V @ 50 Ω
0 - 10 V @ Hi-Z
100 mA Max Current

Power Input

4-Pin Female

BNC Female
PinConnection
1-12 V
2Ground
3+5 V
4+12 V

Photodiode Tutorial

Theory of Operation

A junction photodiode is an intrinsic device that behaves similarly to an ordinary signal diode, but it generates a photocurrent when light is absorbed in the depleted region of the junction semiconductor. A photodiode is a fast, highly linear device that exhibits high quantum efficiency based upon the application and may be used in a variety of different applications.

It is necessary to be able to correctly determine the level of the output current to expect and the responsivity based upon the incident light. Depicted in Figure 1 is a junction photodiode model with basic discrete components to help visualize the main characteristics and gain a better understanding of the operation of Thorlabs' photodiodes.

Equation 1
Photodiode Circuit Diagram
Figure 1: Photodiode Model

Photodiode Terminology

Responsivity
The responsivity of a photodiode can be defined as a ratio of generated photocurrent (IPD) to the incident light power (P) at a given wavelength:

Equation 2

Modes of Operation (Photoconductive vs. Photovoltaic)
A photodiode can be operated in one of two modes: photoconductive (reverse bias) or photovoltaic (zero-bias). Mode selection depends upon the application's speed requirements and the amount of tolerable dark current (leakage current).

Photoconductive
In photoconductive mode, an external reverse bias is applied, which is the basis for our DET series detectors. The current measured through the circuit indicates illumination of the device; the measured output current is linearly proportional to the input optical power. Applying a reverse bias increases the width of the depletion junction producing an increased responsivity with a decrease in junction capacitance and produces a very linear response. Operating under these conditions does tend to produce a larger dark current, but this can be limited based upon the photodiode material. (Note: Our DET detectors are reverse biased and cannot be operated under a forward bias.)

Photovoltaic
In photovoltaic mode the photodiode is zero biased. The flow of current out of the device is restricted and a voltage builds up. This mode of operation exploits the photovoltaic effect, which is the basis for solar cells. The amount of dark current is kept at a minimum when operating in photovoltaic mode.

Dark Current
Dark current is leakage current that flows when a bias voltage is applied to a photodiode. When operating in a photoconductive mode, there tends to be a higher dark current that varies directly with temperature. Dark current approximately doubles for every 10 °C increase in temperature, and shunt resistance tends to double for every 6 °C rise. Of course, applying a higher bias will decrease the junction capacitance but will increase the amount of dark current present.

The dark current present is also affected by the photodiode material and the size of the active area. Silicon devices generally produce low dark current compared to germanium devices which have high dark currents. The table below lists several photodiode materials and their relative dark currents, speeds, sensitivity, and costs.

MaterialDark CurrentSpeedSensitivityaCost
Silicon (Si)LowHigh Speed400 - 1000 nmLow
Germanium (Ge)HighLow Speed900 - 1600 nmLow
Gallium Phosphide (GaP)LowHigh Speed150 - 550 nmModerate
Indium Gallium Arsenide (InGaAs)LowHigh Speed800 - 1800 nmModerate
Indium Arsenide Antimonide (InAsSb)HighLow Speed1000 - 5800 nmHigh
Extended Range Indium Gallium Arsenide (InGaAs)HighHigh Speed1200 - 2600 nmHigh
Mercury Cadmium Telluride (MCT, HgCdTe)HighLow Speed2000 - 5400 nmHigh
  • Approximate

Junction Capacitance
Junction capacitance (Cj) is an important property of a photodiode as this can have a profound impact on the photodiode's bandwidth and response. It should be noted that larger diode areas encompass a greater junction volume with increased charge capacity. In a reverse bias application, the depletion width of the junction is increased, thus effectively reducing the junction capacitance and increasing the response speed.

Bandwidth and Response
A load resistor will react with the photodetector junction capacitance to limit the bandwidth. For best frequency response, a 50 Ω terminator should be used in conjunction with a 50 Ω coaxial cable. The bandwidth (fBW) and the rise time response (tr) can be approximated using the junction capacitance (Cj) and the load resistance (RLOAD):

Equation 3

Terminating Resistance
A load resistance is used to convert the generated photocurrent into a voltage (VOUT) for viewing on an oscilloscope:

Equation 4

Depending on the type of the photodiode, load resistance can affect the response speed. For maximum bandwidth, we recommend using a 50 Ω coaxial cable with a 50 Ω terminating resistor at the opposite end of the cable. This will minimize ringing by matching the cable with its characteristic impedance. If bandwidth is not important, you may increase the amount of voltage for a given light level by increasing RLOAD. In an unmatched termination, the length of the coaxial cable can have a profound impact on the response, so it is recommended to keep the cable as short as possible.

Shunt Resistance
Shunt resistance represents the resistance of the zero-biased photodiode junction. An ideal photodiode will have an infinite shunt resistance, but actual values may range from the order of ten Ω to thousands of MΩ and is dependent on the photodiode material. For example, and InGaAs detector has a shunt resistance on the order of 10 MΩ while a Ge detector is in the kΩ range. This can significantly impact the noise current on the photodiode. For most applications, however, the high resistance produces little effect and can be ignored.

Series Resistance
Series resistance is the resistance of the semiconductor material, and this low resistance can generally be ignored. The series resistance arises from the contacts and the wire bonds of the photodiode and is used to mainly determine the linearity of the photodiode under zero bias conditions.

Common Operating Circuits

Reverse Biased DET Circuit
Figure 2: Reverse-Biased Circuit (DET Series Detectors)

The DET series detectors are modeled with the circuit depicted above. The detector is reverse biased to produce a linear response to the applied input light. The amount ofphotocurrent generated is based upon the incident light and wavelength and can be viewed on an oscilloscope by attaching a load resistance on the output. The function of the RC filter is to filter any high frequency noise from the input supply that may contribute to a noisy output.

Reverse Biased DET Circuit
Figure 3: Amplified Detector Circuit

One can also use a photodetector with an amplifier for the purpose of achieving high gain. The user can choose whether to operate in Photovoltaic of Photoconductive modes. There are a few benefits of choosing this active circuit:

  • Photovoltaic mode: The circuit is held at zero volts across the photodiode, since point A is held at the same potential as point B by the operational amplifier. This eliminates the possibility of dark current.
  • Photoconductive mode: The photodiode is reversed biased, thus improving the bandwidth while lowering the junction capacitance. The gain of the detector is dependent on the feedback element (Rf). The bandwidth of the detector can be calculated using the following:

Equation 5

where GBP is the amplifier gain bandwidth product and CD is the sum of the junction capacitance and amplifier capacitance.

Effects of Chopping Frequency

The photoconductor signal will remain constant up to the time constant response limit. Many detectors, including PbS, PbSe, HgCdTe (MCT), and InAsSb, have a typical 1/f noise spectrum (i.e., the noise decreases as chopping frequency increases), which has a profound impact on the time constant at lower frequencies.

The detector will exhibit lower responsivity at lower chopping frequencies. Frequency response and detectivity are maximized for

Photoconductor Chopper Equation

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Posted Comments:
Poster: tcohen
Posted Date: 2012-06-01 09:36:00.0
Response from Tim at Thorlabs: Thank you for your interest! We are often able to provide components individually. I will contact you to discuss the details.
Poster: stan
Posted Date: 2012-05-31 14:24:17.0
Do you have a way to purchase just the casing for this device? I would like to build a few custom detectors for my lab, but cost of design & machining custom cases is much larger than PCBs.
Poster: tcohen
Posted Date: 2012-02-24 13:55:00.0
Response from Tim at Thorlabs to Victor: Thank you for your question. Both the PDA10DT and the PDA10JT use Borosilicate glass.
Poster: victor.karaganov
Posted Date: 2012-02-23 18:04:00.0
Do PDA10DT and PDA10JT have windows? What is the window material?
Poster: Thorlabs
Posted Date: 2010-07-28 10:32:00.0
Response from Javier at Thorlabs to blee66: Thank you for your feedback. You can certainly amplify the signal from the detector. The disadvantage with multistage designs is that both the signal and noise are amplified. So, you need to take offset into account. In order to reach the 70 dB level, you will need to provide a voltage gain of about 300 V/V.
Poster: blee66
Posted Date: 2010-07-26 18:33:14.0
This detector would be perfect for me, except that I need to maintain 1 MHz bandwidth at the 70 dB gain setting. Has anyone tried to further amplify the signal out of this detector? My thought is to leave the detector on the 20 dB setting (where the gain bandwidth is still sufficiently high) and then amplify the output to the needed level. Any thoughts?
Poster: zarebagh
Posted Date: 2010-07-18 11:52:49.0
Hi, I would like to know if there is any way to reduce the TEC temp under -10 C. The idea is to improve the SNR!
Poster: Adam
Posted Date: 2010-05-25 09:15:56.0
A response from Adam at Thorlabs: NEP is the noise floor of a detector, normalized to a 1Hz bandwidth and is expressed in Watts per square root bandwidth. To derive NEP, two parameters must be measured: the detector responsivity at a specified frequency, and the detector voltage noise at the same frequency. Basically the frequency component is removed to make the detectors more comparable. So in the case of the PDA10DT the NEP is a factor of 10 better at the roughly equivalent gain setting (20dB or ~15kV/A) to the PDA10D (10kV/A). As for the differences between the cooled and uncooled version it is more than just the NEP. The uncooled version is very limited in performance due to high offsets and high NEP. Cooling the detector has a number of effects. First it significantly lowers the dark current offset produced by long wavelength InGaAs detectors. This allows us to add significantly more gain before the dark current offset becomes a problem. Cooling detectors lowers the thermal induced noise. One of the noise sources of these detectors is due to variations in temperature effecting the offset. This appears as additional noise (usually low BW) on the output. By stabilizing the temperature and holding it low enough that the dark current is lower decreases this noise source significantly. Overall the noise performance is significantly better in the PDA10DT as well as the dark current. The addition of the LPF adjustment can lower the noise even more if BW can be limited.
Poster:
Posted Date: 2010-05-24 17:04:00.0
Specifications as current shown on your web: Uncooled PDA10D: DC - 15 MHz 3.5x10^-11 W/Hz^1/2 Cooled PDA10DT: NEP, Max (@ 1 MHz, 0 dB Gain, 50 ?) 2.71 x 10^-11 W/Hz^1/2 Please help me understand your NEP numbers for these two products, in order to calculate the NEP power in Watts at 1 MHz i multiply both numbers by SQRT(10^6), but you indicate the NEP data point for the cooled sensor is valid "@ 1 MHz". I guess you really mean DC to 1 MHz, please confirm. The reason i am so focused here is the model with cooling has a roughly 25% better NEP than the one without, seems like a big price to pay for such a small improvement in NEP.
Poster: Adam
Posted Date: 2010-04-27 12:07:03.0
A response from Adam at Thorlabs to sking: The current diode that is used in the PDA10DT is not designed for use below 1um and we do not have response information below 1.2um. I will send you the extra data that we can provide via email.
Poster: sking
Posted Date: 2010-04-27 11:06:06.0
Does the detector have any respnse below the 1um which you specify on the spec sheet? Do you have the product details for the actaul photodoiode in the detector e.g.hamamatsu etc...
Poster: klee
Posted Date: 2009-08-13 16:49:00.0
A response from Ken at Thorlabs to dedeianc: The rise time depends on the gain and filter settings. Since there are 8 gain settings and 8 filter settings, there are 64 gain/filter combinations and rise time is different for each combination. The risetime however can be approximated to tr = 0.35/BW and the maximum bandwidth for the PDA10DT is 1MHz.
Poster: dedeianc
Posted Date: 2009-08-13 11:38:21.0
By time resolution I mean rise time
Poster: klee
Posted Date: 2009-08-13 10:09:56.0
A response from Ken at Thorlabs to dedeianc: Please explain what you mean by "time resolution".
Poster: dedeianc
Posted Date: 2009-08-11 11:41:44.0
What is the time resolution of these detectors
Poster: klee
Posted Date: 2009-07-09 11:11:00.0
A response from Ken at Thorlabs to Crice: We do not have CW saturation or damage threshold. Although CW saturations is in the range of 1-2mW as a safe number. For the NEP, there are numerous combinations with 8 gain steps and 8 possible LPF setting for each. We do provide the noise in graphs, worst to best case.
Poster: crice
Posted Date: 2009-07-05 20:07:29.0
What is the NEP (Jones), CW Saturation (Watts), and Damage Threshold (Watts) for this detector?
Poster: klee
Posted Date: 2009-06-23 11:13:56.0
A response from Ken at Thorlabs to xindoutoya: These detectors only have voltage output through the BNC connector. There is no USB or any other digital signal output.
Poster: xindoutoya
Posted Date: 2009-06-23 01:15:41.0
I have a question about "Extended Range InGaAs Detectors": is there a USB connection cable between the product and a computer? Please reply to me as soon as possible. Thanks very much.
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HgCdTe (MCT) TEC Detector: 2.0 - 5.4 µm
Item #PDA10JT(-EC)
Click Image to Enlarge
PDA10JT
Detector Material HgCdTe (MCT)
Wavelength Range 2.0 - 5.4 µm
Peak Wavelength 4.8 µm
Peak Responsivity 300 V/W
Active Area 1 mm × 1 mm Square
Gain Settings 0, 4, 10, 16, 22, 28, 34, 40 dB
Low-Pass Filter Bandwidth Range 1.25 kHz to 160 kHz
Detector Temperature -30 °C
Noise-Equivalent Power (NEP) 2.08 × 10-11 W/√Hz
(for 40 dB Gain and 160 kHz Filter Bandwidth)

More detailed specifications are available in the Specs tab.

  • Detects Chopped or Pulsed Mid-IR Light from 2.0 to 5.4 µm
  • Thermoelectrically Cooled to -30 °C to Reduce Thermal Noise
  • 1 mm x 1 mm Active Area
  • Variable Gain Amplifier (0.8 V/V to 100 V/V)
  • Variable Low-Pass Filter Bandwidth (1.25 kHz to 160 kHz)
  • Internal SM1 (1.035"-40) Threading
Based on your currency / country selection, your order will ship from Newton, New Jersey  
+1 Qty Docs Part Number - Universal/Imperial Price Available / Ships
PDA10JT Support Documentation PDA10JT HgCdTe Amplified Detector with TEC, 2.0 - 5.4 µm, 1 mm2, 100 - 120 VAC $3,897.00
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+1 Qty Docs Part Number - Metric Price Available / Ships
PDA10JT-EC Support Documentation PDA10JT-EC HgCdTe Amplified Detector with TEC, 2.0 - 5.4 µm, 1 mm2, 220 - 240 VAC $3,897.00
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