Features

• Zero Order Waveplate
• AR-Coating Performance: R_avg <0.5% per surface
• Clear Aperture: Ø10 mm
• Post Mountable (8-32 and M4 Adapters Included)
• Custom Wavelength Versions Available

Thorlabs' Variable Beamsplitter and Attenuator allows the user to continuously vary the transmitted intensity of a linearly polarized beam of light. The attenuator accomplishes this by using a zero-order wave plate in a rotation mount and a polarizing beamsplitter cube. This combination allows it to achieve split ratios of 1:99 to 99:1 for P:S polarized light. Applications include holography and interferometry.

The Variable Beamsplitter and Attenuator is aligned to be easily incorporated into systems using Thorlabs' SM1 series of lens tubes and 30 mm cage systems. The attenuator uses a half-wave plate mounted in a compact rotation mount design that will not interfere with a cube connector (CM1-CC) or cage rods. This allows wave plate rotation for continuous adjustment to the attenuation/split ratio.

Additional SM05- or SM1-Mounted Waveplates can be used to isolate the input beam port from back reflections or to rotate the output polarization, shown in the Applications tab.

VBA05 Series Specifications

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Isolation of the Input Port

In normal operation, the variable beamsplitter/attenuator utilizes a half-wave plate to rotate the polarization of a previously linearly polarized beam of light. At the beamsplitter interface, p-polarized light will be transmitted, while s-polarized light will be reflected. By choosing the correct orientation with the half-wave plate, one can determine the amount of p-polarized and s-polarized light incident upon the interface (as shown in Figure 1 below).

Figure 1. Normal Variable Beamsplitter Operation

Once through the beamsplitter, light may be reflected back from various optical elements in the system. To protect your light source from these reflections, a simple isolator may be created by the addition of a quater-wave plate.

This isolation will utilize the transmission/reflection properties of polarized light at the beamsplitter interface. In order to isolate the input port, the polarization of the exit beams must be rotated 90 degrees.

As seen in Figure 2 below, once light exits the beamsplitter, the quater-wave plate converts the p-polarized light into right circularly polarized light. To ensure circular polarization, the polarization axis of the output beam (the beam transmitted straight through the beamsplitter cube in Figure 2) must be incident upon the quarter-wave plate at an angle of 45° with respect to the fast and slow axis. This can be accomplished, as shown above, by using our CRM1P Precision Cage Rotation Mount.

Figure 2. Initial Pass through System

Figure 3. Reflected Beam Path

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Upon reflection from the front surface of a lens or mirror, the polarization will be transformed from right to left handed. As seen in figure 3 below, as the light passes through the quarter-wave plate, it will once again be converted to a linearly polarized beam.

It is important to mention that this beam will be orthoganal to the initial polarization direction and will be reflected towards the unused port of the beamsplitter. This prevents contamination of the two linearly polarized output beams.

To truly isolate the input port of the Variable Beamsplitter/Attenuator, two quater-wave plates must be used. The polarization of each output beam must be individually rotated and accounted for. For isolation of high-power beams or greater isolation levels, please see our line of optical isolators.

To build the application above, the following parts were used:

Laser Induced Damage Threshold Tutorial

This tutorial is a general overview of how laser induced damage thresholds are measured and how the values may be utilized in determining the appropriateness of an optic for a given application. When choosing optics, it is important to understand the Laser Induced Damage Threshold (LIDT) of the optics being used. The LIDT for an optic greatly depends on the type of laser you are using. Continuous wave (CW) lasers typically cause damage from thermal effects (absorption either in the coating or in the substrate). Pulsed lasers, on the other hand, often strip electrons from the lattice structure of an optic before causing thermal damage. Note that the guideline presented here assumes room temperature operation and optics in new condition (i.e., within scratch-dig spec, surface free of contamination, etc.).

Testing Method

Thorlabs' LIDT testing is done in compliance with ISO/DIS11254 specifications. A standard 1-on-1 testing regime is performed to test the damage threshold.

First, a low-power/energy beam is directed to the optic under test. The optic is exposed in 10 locations to this laser beam for a set duration of time (CW) or number of pulses (prf specified). After exposure, the optic is examined by a microscope (~100X magnification) for any visible damage. The number of locations that are damaged at a particular power/energy level is recorded. Next, the power/energy is either increased or decreased and the optic is exposed at 10 new locations. This process is repeated until damage is observed. The damage threshold is then assigned to be the highest power/energy that the optic can withstand without causing damage. A histogram such as that below represents the testing of one BB1-E02 mirror.

According to the test, the damage threshold of the mirror was 2.00 J/cm² (532 nm, 10 ns pulse, 10 Hz, Ø0.803 mm). Please keep in mind that it is only representative of one coating run and that Thorlabs' specified damage thresholds account for coating variances.

Continuous Wave and Long-Pulse Lasers

When an optic is damaged by a continuous wave (CW) laser, it is usually due to the melting of the surface as a result of absorbing the laser's energy or damage to the optical coating (antireflection) [1]. Pulsed lasers with pulse lengths longer than 1 µs can be treated as CW lasers for LIDT discussions. Additionally, when pulse lengths are between 1 ns and 1 µs, LIDT can occur either because of absorption or a dielectric breakdown (must check both CW and pulsed LIDT). Absorption is either due to an intrinsic property of the optic or due to surface irregularities; thus LIDT values are only valid for optics meeting or exceeding the surface quality specifications given by a manufacturer. While many optics can handle high power CW lasers, cemented (e.g., achromatic doublets) or highly absorptive (e.g., ND filters) optics tend to have lower CW damage thresholds. These lower thresholds are due to absorption or scattering in the cement or metal coating.

Pulsed lasers with high pulse repetition frequencies (PRF) may behave similarly to CW beams. Unfortunately, this is highly dependent on factors such as absorption and thermal diffusivity, so there is no reliable method for determining when a high PRF laser will damage an optic due to thermal effects. For beams with a large PRF both the average and peak powers must be compared to the equivalent CW power. Additionally, for highly transparent materials, there is little to no drop in the LIDT with increasing PRF.

In order to use the specified CW damage threshold of an optic, it is necessary to know the following:

1. Wavelength of your laser
2. Linear power density of your beam (total power divided by 1/e² spot size)
3. Beam diameter of your beam (1/e²)
4. Approximate intensity profile of your beam (e.g., Gaussian)

The power density of your beam should be calculated in terms of W/cm. The graph to the right shows why the linear power density provides the best metric for long pulse and CW sources. Under these conditions, linear power density scales independently of spot size; one does not need to compute an adjusted LIDT to adjust for changes in spot size. This calculation assumes a uniform beam intensity profile. You must now consider hotspots in the beam or other nonuniform intensity profiles and roughly calculate a maximum power density. For reference, a Gaussian beam typically has a maximum power density that is twice that of the 1/e² beam (see lower right).

Now compare the maximum power density to that which is specified as the LIDT for the optic. If the optic was tested at a wavelength other than your operating wavelength, the damage threshold must be scaled appropriately. A good rule of thumb is that the damage threshold has a linear relationship with wavelength such that as you move to shorter wavelengths, the damage threshold decreases (i.e., a LIDT of 10 W/cm at 1310 nm scales to 5 W/cm at 655 nm). While this rule of thumb provides a general trend, it is not a quantitative analysis of LIDT vs wavelength. In CW applications, for instance, damage scales more strongly with absorption in the coating and substrate, which does not necessarily scale well with wavelength. While the above procedure provides a good rule of thumb for LIDT values, please contact Tech Support if your wavelength is different from the specified LIDT wavelength. If your power density is less than the adjusted LIDT of the optic, then the optic should work for your application.

Please note that we have a buffer built in between the specified damage thresholds online and the tests which we have done, which accommodates variation between batches. Upon request, we can provide individual test information and a testing certificate. The damage analysis will be carried out on a similar optic (customer's optic will not be damaged). Testing may result in additional costs or lead times. Contact Tech Support for more information.

Pulsed Lasers

As previously stated, pulsed lasers typically induce a different type of damage to the optic than CW lasers. Pulsed lasers often do not heat the optic enough to damage it; instead, pulsed lasers produce strong electric fields capable of inducing dielectric breakdown in the material. Unfortunately, it can be very difficult to compare the LIDT specification of an optic to your laser. There are multiple regimes in which a pulsed laser can damage an optic and this is based on the laser's pulse length. The highlighted columns in the table below outline the pulse lengths that our specified LIDT values are relevant for.

Pulses shorter than 10^-11 s cannot be compared to our specified LIDT values with much reliability. In this ultra-short-pulse regime various mechanics, such as multiphoton-avalanche ionization, take over as the predominate damage mechanism [2]. In contrast, pulses between 10^-9 s and 10^-6 s may cause damage to an optic either because of dielectric breakdown or thermal effects. This means that both CW and pulsed damage thresholds must be compared to the laser beam to determine whether the optic is suitable for your application.

When comparing an LIDT specified for a pulsed laser to your laser, it is essential to know the following:

1. Wavelength of your laser
2. Energy density of your beam (total energy divided by 1/e² area)
3. Pulse length of your laser
4. Pulse repetition frequency (prf) of your laser
5. Beam diameter of your laser (1/e² )
6. Approximate intensity profile of your beam (e.g., Gaussian)

The energy density of your beam should be calculated in terms of J/cm². The graph to the right shows why the energy density provides the best metric for short pulse sources. Under these conditions, energy density scales independently of spot size, one does not need to compute an adjusted LIDT to adjust for changes in spot size. This calculation assumes a uniform beam intensity profile. You must now adjust this energy density to account for hotspots or other nonuniform intensity profiles and roughly calculate a maximum energy density. For reference a Gaussian beam typically has a maximum power density that is twice that of the 1/e² beam.

Now compare the maximum energy density to that which is specified as the LIDT for the optic. If the optic was tested at a wavelength other than your operating wavelength, the damage threshold must be scaled appropriately [3]. A good rule of thumb is that the damage threshold has an inverse square root relationship with wavelength such that as you move to shorter wavelengths, the damage threshold decreases (i.e., a LIDT of 1 J/cm² at 1064 nm scales to 0.7 J/cm² at 532 nm):

You now have a wavelength-adjusted energy density, which you will use in the following step.

Beam diameter is also important to know when comparing damage thresholds. While the LIDT, when expressed in units of J/cm², scales independently of spot size; large beam sizes are more likely to illuminate a larger number of defects which can lead to greater variances in the LIDT [4]. For data presented here, a <1 mm beam size was used to measure the LIDT. For beams sizes greater than 5 mm, the LIDT (J/cm²) will not scale independently of beam diameter due to the larger size beam exposing more defects.

The pulse length must now be compensated for. The longer the pulse duration, the more energy the optic can handle. For pulse widths between 1 - 100 ns, an approximation is as follows:

Use this formula to calculate the Adjusted LIDT for an optic based on your pulse length. If your maximum energy density is less than this adjusted LIDT maximum energy density, then the optic should be suitable for your application. Keep in mind that this calculation is only used for pulses between 10^-11 s and 10^-9 s. For pulses between 10^-9 s and 10^-6 s, the CW LIDT must also be checked before deeming the optic appropriate for your application.

Please note that we have a buffer built in between the specified damage thresholds online and the tests which we have done, which accommodates variation between batches. Upon request, we can provide individual test information and a testing certificate. Contact Tech Support for more information.

[1] R. M. Wood, Optics and Laser Tech. 29, 517 (1997).
[2] Roger M. Wood, Laser-Induced Damage of Optical Materials (Institute of Physics Publishing, Philadelphia, PA, 2003).
[3] C. W. Carr et al., Phys. Rev. Lett. 91, 127402 (2003).
[4] N. Bloembergen, Appl. Opt. 12, 661 (1973).