Features

• N-BK7 Substrate
• Broadband AR Coating for the 1050-1620 nm Range
• Wavelength Range: 350 nm - 2.0 μm (Uncoated)
• Focal Lengths Available from 10 to 1000 mm

These Plano-Convex Lenses are fabricated from RoHS-compliant BK7 glass (N-BK7) and feature an antireflection coating for the 1050-1620 nm range. N-BK7 is probably the most common optical glass used for high quality optical components. It is typically chosen whenever the additional benefits of UV fused silica (i.e., good transmission further into the UV and a lower coefficient of thermal expansion) are not necessary.

These lenses are popular for many applications. They have a positive focal length and near-best-form shape for infinite and finite conjugate applications. Plano-convex lenses focus a collimated beam to the back focus and collimate light from a point source.

To minimize the introduction of spherical aberration, a collimated light source should be incident on the curved surface of the lens when being focused and a point light source should be incident on the planar surface when being collimated. The focal length of each lens can be calculated using a simplified thick lens equation:

f= R/(n-1),

where n is the index of refraction and R is the radius of curvature of the lens surface. These lenses are fabricated from N-BK7, which has an Abbe Number of 64.17; this value is an indicator of the dispersion.

Our N-BK7 Plano-Convex lenses are also available uncoated or with an antireflection coating for either the 350 - 700 nm (-A designation) or 650 - 1050 nm (-B designation) range. Links to these pages are provided in the selection guide table to the right and coating information can be found on theGraphs tab.

Below is the transmission curve for N-BK7, a RoHS-compliant form of BK7. Total Transmission is shown for a 10 mm thick, uncoated sample and includes surface reflections. Each N-BK7 plano-convex lenses can be ordered uncoated or with one of the following broadband AR coatings: 350-700 nm (Designated with -A), 650-1050 nm (Designated as -B), or 1050-1620 nm (Designated as -C).

These high-performance multilayer AR coatings have an average reflectance of less than 0.5% (per surface) across the specified wavelength ranges. These coatings are designed for angles of incidence between 0 and 30 degrees (0.5 NA). For optics intended to be used at large incident angles, consider using a custom coating optimized at a 45° angle of incidence; these coatings are effective from 25° to 52°. The plot shown below indicates the performance of the standard coatings in this family as a function of wavelength. Broadband coatings have a typical absorption of 0.25%, which is not shown in the reflectivity plots.

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The focal length of a thick spherical lens can be calculated using the thick lens equation below. In this expression, n_l is the index of refraction of the lens, R₁ and R₂ are the radii of curvature for surfaces 1 and 2, respectively, and d is the center thickness of the lens.

When using the thick lens equation to calculate the focal length of a plano-convex lens, R₁=∞ and R₂=-R. Note that the minus sign in front of R is due to the sign convention used when deriving the thick lens equations and values of R are reported in the Specs tab as well as on the mechanical drawing for each lens. Therefore, via substitution, the thick lens equation becomes

The focal length of the lens calculated using the simplified thick lens equation directly above is the distance between the second (back) principle plane (H") and the position at which a collimated beam incident on the curved surface of the plano-convex is focused. The principle plane positions of a thick lens can be calculated with the following equations:

and

However, as with the thick lens equation, H' simplifies to zero and H" simplifies to

when used to calculate the principle plane locations of plano-convex lenses. f_b is the back focal length of the lens, which is often referred to as the working distance of the lens.

Laser Induced Damage Threshold Tutorial

This tutorial is a general overview of how laser induced damage thresholds are measured and how the values may be utilized in determining the appropriateness of an optic for a given application. When choosing optics, it is important to understand the Laser Induced Damage Threshold (LIDT) of the optics being used. The LIDT for an optic greatly depends on the type of laser you are using. Continuous wave (CW) lasers typically cause damage from thermal effects (absorption either in the coating or in the substrate). Pulsed lasers, on the other hand, often strip electrons from the lattice structure of an optic before causing thermal damage. Note that the guideline presented here assumes room temperature operation and optics in new condition (i.e., within scratch-dig spec, surface free of contamination, etc.).

Testing Method

Thorlabs' LIDT testing is done in compliance with ISO/DIS11254 specifications. A standard 1-on-1 testing regime is performed to test the damage threshold.

First, a low-power/energy beam is directed to the optic under test. The optic is exposed in 10 locations to this laser beam for a set duration of time (CW) or number of pulses (prf specified). After exposure, the optic is examined by a microscope (~100X magnification) for any visible damage. The number of locations that are damaged at a particular power/energy level is recorded. Next, the power/energy is either increased or decreased and the optic is exposed at 10 new locations. This process is repeated until damage is observed. The damage threshold is then assigned to be the highest power/energy that the optic can withstand without causing damage. A histogram such as that below represents the testing of one BB1-E02 mirror.

According to the test, the damage threshold of the mirror was 2.00 J/cm² (532 nm, 10 ns pulse, 10 Hz, Ø0.803 mm). Please keep in mind that it is only representative of one coating run and that Thorlabs' specified damage thresholds account for coating variances.

Continuous Wave and Long-Pulse Lasers

When an optic is damaged by a continuous wave (CW) laser, it is usually due to the melting of the surface as a result of absorbing the laser's energy or damage to the optical coating (antireflection) [1]. Pulsed lasers with pulse lengths longer than 1 µs can be treated as CW lasers for LIDT discussions. Additionally, when pulse lengths are between 1 ns and 1 µs, LIDT can occur either because of absorption or a dielectric breakdown (must check both CW and pulsed LIDT). Absorption is either due to an intrinsic property of the optic or due to surface irregularities; thus LIDT values are only valid for optics meeting or exceeding the surface quality specifications given by a manufacturer. While many optics can handle high power CW lasers, cemented (e.g., achromatic doublets) or highly absorptive (e.g., ND filters) optics tend to have lower CW damage thresholds. These lower thresholds are due to absorption or scattering in the cement or metal coating.

Pulsed lasers with high pulse repetition frequencies (PRF) may behave similarly to CW beams. Unfortunately, this is highly dependent on factors such as absorption and thermal diffusivity, so there is no reliable method for determining when a high PRF laser will damage an optic due to thermal effects. For beams with a large PRF both the average and peak powers must be compared to the equivalent CW power. Additionally, for highly transparent materials, there is little to no drop in the LIDT with increasing PRF.

In order to use the specified CW damage threshold of an optic, it is necessary to know the following:

1. Wavelength of your laser
2. Linear power density of your beam (total power divided by 1/e² spot size)
3. Beam diameter of your beam (1/e²)
4. Approximate intensity profile of your beam (e.g., Gaussian)

The power density of your beam should be calculated in terms of W/cm. The graph to the right shows why the linear power density provides the best metric for long pulse and CW sources. Under these conditions, linear power density scales independently of spot size; one does not need to compute an adjusted LIDT to adjust for changes in spot size. This calculation assumes a uniform beam intensity profile. You must now consider hotspots in the beam or other nonuniform intensity profiles and roughly calculate a maximum power density. For reference, a Gaussian beam typically has a maximum power density that is twice that of the 1/e² beam (see lower right).

Now compare the maximum power density to that which is specified as the LIDT for the optic. If the optic was tested at a wavelength other than your operating wavelength, the damage threshold must be scaled appropriately. A good rule of thumb is that the damage threshold has a linear relationship with wavelength such that as you move to shorter wavelengths, the damage threshold decreases (i.e., a LIDT of 10 W/cm at 1310 nm scales to 5 W/cm at 655 nm). While this rule of thumb provides a general trend, it is not a quantitative analysis of LIDT vs wavelength. In CW applications, for instance, damage scales more strongly with absorption in the coating and substrate, which does not necessarily scale well with wavelength. While the above procedure provides a good rule of thumb for LIDT values, please contact Tech Support if your wavelength is different from the specified LIDT wavelength. If your power density is less than the adjusted LIDT of the optic, then the optic should work for your application.

Please note that we have a buffer built in between the specified damage thresholds online and the tests which we have done, which accommodates variation between batches. Upon request, we can provide individual test information and a testing certificate. The damage analysis will be carried out on a similar optic (customer's optic will not be damaged). Testing may result in additional costs or lead times. Contact Tech Support for more information.

Pulsed Lasers

As previously stated, pulsed lasers typically induce a different type of damage to the optic than CW lasers. Pulsed lasers often do not heat the optic enough to damage it; instead, pulsed lasers produce strong electric fields capable of inducing dielectric breakdown in the material. Unfortunately, it can be very difficult to compare the LIDT specification of an optic to your laser. There are multiple regimes in which a pulsed laser can damage an optic and this is based on the laser's pulse length. The highlighted columns in the table below outline the pulse lengths that our specified LIDT values are relevant for.

Pulses shorter than 10^-11 s cannot be compared to our specified LIDT values with much reliability. In this ultra-short-pulse regime various mechanics, such as multiphoton-avalanche ionization, take over as the predominate damage mechanism [2]. In contrast, pulses between 10^-9 s and 10^-6 s may cause damage to an optic either because of dielectric breakdown or thermal effects. This means that both CW and pulsed damage thresholds must be compared to the laser beam to determine whether the optic is suitable for your application.

When comparing an LIDT specified for a pulsed laser to your laser, it is essential to know the following:

1. Wavelength of your laser
2. Energy density of your beam (total energy divided by 1/e² area)
3. Pulse length of your laser
4. Pulse repetition frequency (prf) of your laser
5. Beam diameter of your laser (1/e² )
6. Approximate intensity profile of your beam (e.g., Gaussian)

The energy density of your beam should be calculated in terms of J/cm². The graph to the right shows why the energy density provides the best metric for short pulse sources. Under these conditions, energy density scales independently of spot size, one does not need to compute an adjusted LIDT to adjust for changes in spot size. This calculation assumes a uniform beam intensity profile. You must now adjust this energy density to account for hotspots or other nonuniform intensity profiles and roughly calculate a maximum energy density. For reference a Gaussian beam typically has a maximum power density that is twice that of the 1/e² beam.

Now compare the maximum energy density to that which is specified as the LIDT for the optic. If the optic was tested at a wavelength other than your operating wavelength, the damage threshold must be scaled appropriately [3]. A good rule of thumb is that the damage threshold has an inverse square root relationship with wavelength such that as you move to shorter wavelengths, the damage threshold decreases (i.e., a LIDT of 1 J/cm² at 1064 nm scales to 0.7 J/cm² at 532 nm):

You now have a wavelength-adjusted energy density, which you will use in the following step.

Beam diameter is also important to know when comparing damage thresholds. While the LIDT, when expressed in units of J/cm², scales independently of spot size; large beam sizes are more likely to illuminate a larger number of defects which can lead to greater variances in the LIDT [4]. For data presented here, a <1 mm beam size was used to measure the LIDT. For beams sizes greater than 5 mm, the LIDT (J/cm²) will not scale independently of beam diameter due to the larger size beam exposing more defects.

The pulse length must now be compensated for. The longer the pulse duration, the more energy the optic can handle. For pulse widths between 1 - 100 ns, an approximation is as follows:

Use this formula to calculate the Adjusted LIDT for an optic based on your pulse length. If your maximum energy density is less than this adjusted LIDT maximum energy density, then the optic should be suitable for your application. Keep in mind that this calculation is only used for pulses between 10^-11 s and 10^-9 s. For pulses between 10^-9 s and 10^-6 s, the CW LIDT must also be checked before deeming the optic appropriate for your application.

Please note that we have a buffer built in between the specified damage thresholds online and the tests which we have done, which accommodates variation between batches. Upon request, we can provide individual test information and a testing certificate. Contact Tech Support for more information.

[1] R. M. Wood, Optics and Laser Tech. 29, 517 (1997).
[2] Roger M. Wood, Laser-Induced Damage of Optical Materials (Institute of Physics Publishing, Philadelphia, PA, 2003).
[3] C. W. Carr et al., Phys. Rev. Lett. 91, 127402 (2003).
[4] N. Bloembergen, Appl. Opt. 12, 661 (1973).